probe card

Description

The probe card is used to connect to the pad of the tester circuit and die in CP testing. Generally, it functions as a physical interface of the load board. In some cases, it can be attached to the load board through a socket or other interface circuits.

Application: The probe card is applicable to major testing platforms before wafer cutting and IC packaging. The probe card can be used to test the wafer quality and avoid packaging costs for defective products.

Flow

Competence